A Second Look at the Portability of Deep Learning Side-Channel Attacks over EM Traces
Published in 27th International Symposium on Research in Attacks, Intrusions and Defenses (RAID '24), 2024
Recommended citation: M. Ninan, E. Nimmo, S. Reilly, C. Smith, W. Sun, B. Wang, and J. M. Emmert, 'A Second Look at the Portability of Deep Learning Side-Channel Attacks over EM Traces,' Proceedings of the 27th International Symposium on Research in Attacks, Intrusions and Defenses (RAID '24), Padua, Italy, 2024, pp. 630-643. doi: 10.1145/3678890.3678900.
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